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Advanced characterization techniques for thin film solar cells / (Record no. 11312)

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005 - DATE AND TIME OF LATEST TRANSACTION
control field 20171224113724.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS--GENERAL INFORMATION
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007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
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fixed length control field 111017s2011 gw a ob 001 0 eng d
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019 ## -
-- 714799132
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783527636303
Qualifying information (electronic bk.)
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International Standard Book Number 3527636307
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International Standard Book Number 9783527636280
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International Standard Book Number 3527636285
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International Standard Book Number 9783527636297
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Cancelled/invalid ISBN 3527410031
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Cancelled/invalid ISBN 9783527410033
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System control number (OCoLC)757401381
Canceled/invalid control number (OCoLC)714799132
037 ## - SOURCE OF ACQUISITION
Stock number 10.1002/9783527636280
Source of stock number/acquisition Wiley InterScience
Note http://www3.interscience.wiley.com
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Classification number TK8322
Item number .A38 2011eb
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 009070
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.472
Edition number 22
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
245 00 - TITLE STATEMENT
Title Advanced characterization techniques for thin film solar cells /
Statement of responsibility, etc edited by Daniel Abou-Ras, Thomas Kirchartz, and Uwe Rau.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Weinheim, Germany :
Name of publisher, distributor, etc Wiley-VCH,
Date of publication, distribution, etc ©2011.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xxxvi, 547 pages) :
Other physical details illustrations (some color)
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information Machine generated contents note:
-- pt. one
Title Introduction --
Miscellaneous information 1.
Title Introduction to Thin-Film Photovoltaics /
Statement of responsibility Uwe Rau --
Miscellaneous information 1.1.
Title Introduction --
Miscellaneous information 1.2.
Title The Photovoltaic Principle --
Miscellaneous information 1.2.1.
Title The Shockley-Queisser Theory --
Miscellaneous information 1.2.2.
Title From the Ideal Solar Cell to Real Solar Cells --
Miscellaneous information 1.2.3.
Title Light Absorption and Light Trapping --
Miscellaneous information 1.2.4.
Title Charge Extraction --
Miscellaneous information 1.2.5.
Title Nonradiative Recombination --
Miscellaneous information 1.3.
Title Functional Layers in Thin-Film Solar Cells --
Miscellaneous information 1.4.
Title Comparison of Various Thin-Film Solar-Cell Types --
Miscellaneous information 1.4.1.
Title Cu(In, Ga)Se2 --
Miscellaneous information 1.4.1.1.
Title Basic Properties and Technology --
Miscellaneous information 1.4.1.2.
Title Layer-Stacking Sequence and Band Diagram of the Heterostructure --
Miscellaneous information 1.4.2.
Title CdTe --
Miscellaneous information 1.4.2.1.
Title Basic Properties and Technology --
Miscellaneous information 1.4.2.2.
Title Layer-Stacking Sequence and Band Diagram of the Heterostructure --
Miscellaneous information 1.4.3.
Title Thin-Film Silicon Solar Cells --
Miscellaneous information 1.4.3.1.
Title Hydrogenated Amorphous Si (a-Si: H) --
Miscellaneous information 1.4.3.2.
Title Metastability in a-Si: H: The Staebler-Wronski Effect --
Miscellaneous information 1.4.3.3.
Title Hydrogenated Microcrystalline Silicon (& mu;c-Si: H) --
Miscellaneous information 1.4.3.4.
Title Micromorph Tandem Solar Cells.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 1.5.
Title Conclusions --
-- References --
Miscellaneous information pt. Two
Title Device Characterization --
Miscellaneous information 2.
Title Fundamental Electrical Characterization of Thin-Film Solar Cells /
Statement of responsibility Uwe Rau --
Miscellaneous information 2.1.
Title Introduction --
Miscellaneous information 2.2.
Title Current/Voltage Curves --
Miscellaneous information 2.2.1.
Title Shape of Current/Voltage Curves and their Description with Equivalent Circuit Models --
Miscellaneous information 2.2.2.
Title Measurement of Current/Voltage Curves --
Miscellaneous information 2.2.3.
Title Determination of Ideality Factors and Series Resistances --
Miscellaneous information 2.2.4.
Title Temperature-Dependent Current/Voltage Measurements --
Miscellaneous information 2.3.
Title Quantum Efficiency Measurements --
Miscellaneous information 2.3.1.
Title Definition --
Miscellaneous information 2.3.2.
Title Measurement Principle and Calibration --
Miscellaneous information 2.3.3.
Title Quantum Efficiency Measurements of Tandem Solar Cells --
Miscellaneous information 2.3.4.
Title Differential Spectral Response (DSR) Measurements --
Miscellaneous information 2.3.5.
Title Interpretation of Quantum Efficiency Measurements in Thin-Film Silicon Solar Cells --
-- References --
Miscellaneous information 3.
Title Electroluminescence Analysis of Solar Cells and Solar Modules /
Statement of responsibility Uwe Rau --
Miscellaneous information 3.1.
Title Introduction --
Miscellaneous information 3.2.
Title Basics --
Miscellaneous information 3.3.
Title Spectrally Resolved Electroluminescence --
Miscellaneous information 3.4.
Title Spatially Resolved Electroluminescence of c-Si Solar Cells --
Miscellaneous information 3.5.
Title Electroluminescence Imaging of Cu(In, Ga)Se2 Thin-Film Modules.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 3.6.
Title Modeling of Spatially Resolved Electroluminescence --
-- References --
Miscellaneous information 4.
Title Capacitance Spectroscopy of Thin-Film Solar Cells /
Statement of responsibility Pawel Zabierowski --
Miscellaneous information 4.1.
Title Introduction --
Miscellaneous information 4.2.
Title Admittance Basics --
Miscellaneous information 4.3.
Title Sample Requirements --
Miscellaneous information 4.4.
Title Instrumentation --
Miscellaneous information 4.5.
Title Capacitance-Voltage Profiling and the Depletion Approximation --
Miscellaneous information 4.6.
Title Admittance Response of Deep States --
Miscellaneous information 4.7.
Title The Influence of Deep States on CV Profiles --
Miscellaneous information 4.8.
Title DLTS --
Miscellaneous information 4.8.1.
Title DLTS of Thin-Film PV Devices --
Miscellaneous information 4.9.
Title Admittance Spectroscopy --
Miscellaneous information 4.10.
Title Drive Level Capacitance Profiling --
Miscellaneous information 4.11.
Title Photocapacitance --
Miscellaneous information 4.12.
Title The Meyer-Neldel Rule --
Miscellaneous information 4.13.
Title Spatial Inhomogeneities and Interface States --
Miscellaneous information 4.14.
Title Metastability --
-- References --
Miscellaneous information pt. Three
Title Materials Characterization --
Miscellaneous information 5.
Title Characterizing the Light-Trapping Properties of Textured Surfaces with Scanning Near-Field Optical Microscopy /
Statement of responsibility Karsten Bittkau --
Miscellaneous information 5.1.
Title Introduction --
Miscellaneous information 5.2.
Title How Does a Scanning Near-Field Optical Microscope Work? --
Miscellaneous information 5.3.
Title Light Scattering in the Wave Picture --
Miscellaneous information 5.4.
Title The Role of Evanescent Modes for Light Trapping --
Miscellaneous information 5.5.
Title Analysis of Scanning Near-Field Optical Microscopy Images by Fast Fourier Transformation.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 5.6.
Title How to Extract Far-Field Scattering Properties by Scanning Near-Field Optical Microscopy? --
Miscellaneous information 5.7.
Title Conclusion --
-- References --
Miscellaneous information 6.
Title Spectroscopic Ellipsometry /
Statement of responsibility Robert W. Collins --
Miscellaneous information 6.1.
Title Introduction --
Miscellaneous information 6.2.
Title Theory --
Miscellaneous information 6.2.1.
Title Polarized Light --
Miscellaneous information 6.2.2.
Title Reflection from a Single Interface --
Miscellaneous information 6.3.
Title Ellipsometry Instrumentation --
Miscellaneous information 6.3.1.
Title Rotating Analyzer SE for Ex-Situ Applications --
Miscellaneous information 6.3.2.
Title Rotating Compensator SE for Real-Time Applications --
Miscellaneous information 6.4.
Title Data Analysis --
Miscellaneous information 6.4.1.
Title Exact Numerical Inversion --
Miscellaneous information 6.4.2.
Title Least-Squares Regression --
Miscellaneous information 6.4.3.
Title Virtual Interface Analysis --
Miscellaneous information 6.5.
Title RTSE of Thin Film Photovoltaics --
Miscellaneous information 6.5.1.
Title Thin Si: H --
Miscellaneous information 6.5.2.
Title CdTe --
Miscellaneous information 6.5.3.
Title CuInSe2 --
Miscellaneous information 6.6.
Title Summary and Future --
Miscellaneous information 6.7.
Title Definition of Variables --
-- References --
Miscellaneous information 7.
Title Photoluminescence Analysis of Thin-Film Solar Cells /
Statement of responsibility Levent Gutay --
Miscellaneous information 7.1.
Title Introduction --
Miscellaneous information 7.2.
Title Experimental Issues --
Miscellaneous information 7.2.1.
Title Design of the Optical System --
Miscellaneous information 7.2.2.
Title Calibration --
Miscellaneous information 7.2.3.
Title Cryostat --
Miscellaneous information 7.3.
Title Basic Transitions --
Miscellaneous information 7.3.1.
Title Excitons --
Miscellaneous information 7.3.2.
Title Free-Bound Transitions --
Miscellaneous information 7.3.3.
Title Donor-Acceptor Pair Recombination --
Miscellaneous information 7.3.4.
Title Potential Fluctuations.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 7.3.5.
Title Band-Band Transitions --
Miscellaneous information 7.4.
Title Case Studies --
Miscellaneous information 7.4.1.
Title Low-Temperature Photoluminescence Analysis --
Miscellaneous information 7.4.2.
Title Room-Temperature Measurements: Estimation of Voc from PL Yield --
Miscellaneous information 7.4.3.
Title Spatially Resolved Photoluminescence: Absorber Inhomogeneities --
-- References --
Miscellaneous information 8.
Title Steady-State Photocarrier Crating Method /
Statement of responsibility Rudolf Bruggemann --
Miscellaneous information 8.1.
Title Introduction --
Miscellaneous information 8.2.
Title Basic Analysis of SSPG and Photocurrent Response --
Miscellaneous information 8.2.1.
Title Optical Model --
Miscellaneous information 8.2.2.
Title Semiconductor Equations --
Miscellaneous information 8.2.3.
Title Diffusion Length: Ritter-Zeldov-Weiser Analysis --
Miscellaneous information 8.2.3.1.
Title Evaluation Schemes --
Miscellaneous information 8.2.4.
Title More Detailed Analyses --
Miscellaneous information 8.2.4.1.
Title Influence of the Dark Conductivity --
Miscellaneous information 8.2.4.2.
Title Influence of Traps --
Miscellaneous information 8.2.4.3.
Title Minority-Carrier and Majority-Carrier Mobility-Lifetime Products --
Miscellaneous information 8.3.
Title Experimental Setup --
Miscellaneous information 8.4.
Title Data Analysis --
Miscellaneous information 8.5.
Title Results --
Miscellaneous information 8.5.1.
Title Hydrogenated Amorphous Silicon --
Miscellaneous information 8.5.1.1.
Title Temperature and Generation Rate Dependence --
Miscellaneous information 8.5.1.2.
Title Surface Recombination --
Miscellaneous information 8.5.1.3.
Title Electric-Field Influence --
Miscellaneous information 8.5.1.4.
Title Fermi-Level Position --
Miscellaneous information 8.5.1.5.
Title Defects and Light-Induced Degradation.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 8.5.1.6.
Title Thin-Film Characterization and Deposition Methods --
Miscellaneous information 8.5.2.
Title Hydrogenated Amorphous Silicon Alloys --
Miscellaneous information 8.5.3.
Title Hydrogenated Microcrystalline Silicon --
Miscellaneous information 8.5.4.
Title Hydrogenated Microcrystalline Germanium --
Miscellaneous information 8.5.5.
Title Other Thin-Film Semiconductors --
Miscellaneous information 8.6.
Title Density-of-States Determination --
Miscellaneous information 8.7.
Title Summary --
-- References --
Miscellaneous information 9.
Title Time-of-Flight Analysis /
Statement of responsibility Torsten Bronger --
Miscellaneous information 9.1.
Title Introduction --
Miscellaneous information 9.2.
Title Fundamentals of TOF Measurements --
Miscellaneous information 9.2.1.
Title Anomalous Dispersion --
Miscellaneous information 9.2.2.
Title Basic Electronic Properties of Thin-Film Semiconductors --
Miscellaneous information 9.3.
Title Experimental Details --
Miscellaneous information 9.3.1.
Title Accompanying Measurements --
Miscellaneous information 9.3.1.1.
Title Capacitance --
Miscellaneous information 9.3.1.2.
Title Collection --
Miscellaneous information 9.3.1.3.
Title Built-in Field --
Miscellaneous information 9.3.2.
Title Current Decay --
Miscellaneous information 9.3.3.
Title Charge Transient --
Miscellaneous information 9.3.4.
Title Possible Problems --
Miscellaneous information 9.3.4.1.
Title Dielectric Relaxation --
Miscellaneous information 9.3.5.
Title Inhomogeneous Field --
Miscellaneous information 9.4.
Title Analysis of TOF Results --
Miscellaneous information 9.4.1.
Title Multiple Trapping --
Miscellaneous information 9.4.1.1.
Title Overview of the Processes --
Miscellaneous information 9.4.1.2.
Title Energetic Distribution of Carriers --
Miscellaneous information 9.4.1.3.
Title Time Dependence of Electrical Current --
Miscellaneous information 9.4.2.
Title Spatial Charge Distribution --
Miscellaneous information 9.4.2.1.
Title Temperature Dependence.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 9.4.3.
Title Density of States --
Miscellaneous information 9.4.3.1.
Title Widths of Band Tails --
Miscellaneous information 9.4.3.2.
Title Probing of Deep States --
-- References --
Miscellaneous information 10.
Title Electron-Spin Resonance (ESR) in Hydrogenated Amorphous Silicon (a-Si: H) /
Statement of responsibility Jan Behrends --
Miscellaneous information 10.1.
Title Introduction --
Miscellaneous information 10.2.
Title Basics of ESR --
Miscellaneous information 10.3.
Title How to Measure ESR --
Miscellaneous information 10.3.1.
Title ESR Setup and Measurement Procedure --
Miscellaneous information 10.3.2.
Title Pulse ESR --
Miscellaneous information 10.3.3.
Title Sample Preparation --
Miscellaneous information 10.4.
Title The g Tensor and Hyperfine Interaction in Disordered Solids --
Miscellaneous information 10.4.1.
Title Zeeman Energy and g Tensor --
Miscellaneous information 10.4.2.
Title Hyperfine Interaction --
Miscellaneous information 10.4.3.
Title Line-Broadening Mechanisms --
Miscellaneous information 10.5.
Title Discussion of Selected Results --
Miscellaneous information 10.5.1.
Title ESR on Undoped a-Si: H --
Miscellaneous information 10.5.2.
Title LESR on Undoped a-Si: H --
Miscellaneous information 10.5.3.
Title ESR on Doped a-Si: H --
Miscellaneous information 10.5.4.
Title Light-Induced Degradation in a-Si: H --
Miscellaneous information 10.5.4.1.
Title Excess Charge-Carrier Recombination and Weak Si-Si Bond Breaking --
Miscellaneous information 10.5.4.2.
Title Si-H Bond Dissociation and Hydrogen Collision Model --
Miscellaneous information 10.5.4.3.
Title Transformation of Existing Nonparamagnetic Charged Dangling-Bond Defects --
Miscellaneous information 10.6.
Title Alternative ESR Detection --
Miscellaneous information 10.6.1.
Title History of EDMR --
Miscellaneous information 10.6.2.
Title EDMR on a-Si: H Solar Cells.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 10.7.
Title Concluding Remarks --
-- References --
Miscellaneous information 11.
Title Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells /
Statement of responsibility Iris Visoly-Fisher --
Miscellaneous information 11.1.
Title Introduction --
Miscellaneous information 11.2.
Title Experimental Background --
Miscellaneous information 11.2.1.
Title Atomic Force Microscopy --
Miscellaneous information 11.2.1.1.
Title Contact Mode --
Miscellaneous information 11.2.1.2.
Title Noncontact Mode --
Miscellaneous information 11.2.2.
Title Conductive Atomic Force Microscopy --
Miscellaneous information 11.2.3.
Title Scanning Capacitance Microscopy --
Miscellaneous information 11.2.4.
Title Kelvin Probe Force Microscopy --
Miscellaneous information 11.2.5.
Title Scanning Tunneling Microscopy --
Miscellaneous information 11.2.6.
Title Issues of Sample Preparation --
Miscellaneous information 11.3.
Title Selected Applications --
Miscellaneous information 11.3.1.
Title Surface Homogeneity --
Miscellaneous information 11.3.2.
Title Grain Boundaries --
Miscellaneous information 11.3.3.
Title Cross-Sectional Studies --
Miscellaneous information 11.4.
Title Summary --
-- References --
Miscellaneous information 12.
Title Electron Microscopy on Thin Films for Solar Cells /
Statement of responsibility Sebastian S. Schmidt --
Miscellaneous information 12.1.
Title Introduction --
Miscellaneous information 12.2.
Title Scanning Electron Microscopy --
Miscellaneous information 12.2.1.
Title Imaging Techniques --
Miscellaneous information 12.2.2.
Title Electron Backscatter Diffraction --
Miscellaneous information 12.2.3.
Title Energy-Dispersive and Wavelength-Dispersive X-Ray Spectrometry --
Miscellaneous information 12.2.4.
Title Electron-Beam-Induced Current Measurements --
Miscellaneous information 12.2.4.1.
Title Electron-Beam Generation --
Miscellaneous information 12.2.4.2.
Title Charge-Carrier Collection in a Solar Cell.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 12.2.4.3.
Title Experimental Setups --
Miscellaneous information 12.2.4.4.
Title Critical Issues --
Miscellaneous information 12.2.5.
Title Cathodoluminescence --
Miscellaneous information 12.2.5.1.
Title Example: Spectrum Imaging of CdTe Thin Films --
Miscellaneous information 12.2.6.
Title Scanning Probe and Scanning-Probe Microscopy Integrated Platform --
Miscellaneous information 12.2.7.
Title Combination of Various Scanning Electron Microscopy Techniques --
Miscellaneous information 12.3.
Title Transmission Electron Microscopy --
Miscellaneous information 12.3.1.
Title Imaging Techniques --
Miscellaneous information 12.3.1.1.
Title Bright-Field and Dark-Field Imaging in the Conventional Mode --
Miscellaneous information 12.3.1.2.
Title High-Resolution Imaging in the Conventional Mode --
Miscellaneous information 12.3.1.3.
Title Imaging in the Scanning Mode Using an Annular Dark-Field Detector --
Miscellaneous information 12.3.2.
Title Electron Diffraction.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information Note continued:
-- 12.3.2.1.
Title Selected-Area Electron Diffraction in the Conventional Mode --
Miscellaneous information 12.3.2.2.
Title Convergent-Beam Electron Diffraction in the Scanning Mode --
Miscellaneous information 12.3.3.
Title Electron Energy-Loss Spectrometry and Energy-Filtered Transmission Electron Microscopy --
Miscellaneous information 12.3.3.1.
Title Scattering Theory --
Miscellaneous information 12.3.3.2.
Title Experiment and Setup --
Miscellaneous information 12.3.3.3.
Title The Energy-Loss Spectrum --
Miscellaneous information 12.3.3.4.
Title Applications and Comparison with EDX Spectroscopy --
Miscellaneous information 12.3.4.
Title Off-Axis and In-Line Electron Holography --
Miscellaneous information 12.4.
Title Sample Preparation Techniques --
Miscellaneous information 12.4.1.
Title Preparation for Scanning Electron Microscopy --
Miscellaneous information 12.4.2.
Title Preparation for Transmission Electron Microscopy --
-- References --
Miscellaneous information 13.
Title X-Ray and Neutron Diffraction on Materials for Thin-Film Solar Cells /
Statement of responsibility Roland Mainz --
Miscellaneous information 13.1.
Title Introduction --
Miscellaneous information 13.2.
Title Diffraction of X-Rays and Neutron by Matter --
Miscellaneous information 13.3.
Title Neutron Powder Diffraction of Absorber Materials for Thin-Film Solar Cells --
Miscellaneous information 13.3.1.
Title Example: Investigation of Intrinsic Point Defects in Nonstoichiometric CuInSe2 by Neutron Diffraction.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 13.4.
Title Grazing Incidence X-Ray Diffraction (GIXRD) --
Miscellaneous information 13.5.
Title Energy Dispersive X-Ray Diffraction (EDXRD) --
-- References --
Miscellaneous information 14.
Title Raman Spectroscopy on Thin Films for Solar Cells /
Statement of responsibility Alejandro Perez-Rodriguez --
Miscellaneous information 14.1.
Title Introduction --
Miscellaneous information 14.2.
Title Fundamentals of Raman Spectroscopy --
Miscellaneous information 14.3.
Title Vibrational Modes in Crystalline Materials --
Miscellaneous information 14.4.
Title Experimental Considerations --
Miscellaneous information 14.4.1.
Title Laser Source --
Miscellaneous information 14.4.2.
Title Light Collection and Focusing Optics --
Miscellaneous information 14.4.3.
Title Spectroscopic Module --
Miscellaneous information 14.5.
Title Characterization of Thin-Film Photovoltaic Materials --
Miscellaneous information 14.5.1.
Title Identification of Crystalline Structures --
Miscellaneous information 14.5.2.
Title Evaluation of Film Crystallinity --
Miscellaneous information 14.5.3.
Title Chemical Analysis of Semiconducting Alloys --
Miscellaneous information 14.5.4.
Title Nanocrystalline and Amorphous Materials --
Miscellaneous information 14.5.5.
Title Evaluation of Stress --
Miscellaneous information 14.6.
Title Conclusions --
-- References --
Miscellaneous information 15.
Title Soft X-Ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces /
Statement of responsibility Clemens Heske --
Miscellaneous information 15.1.
Title Introduction --
Miscellaneous information 15.2.
Title Characterization Techniques --
Miscellaneous information 15.3.
Title Probing the Chemical Surface Structure: Impact of Wet Chemical Treatments on Thin-Film Solar Cell Absorbers.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 15.4.
Title Probing the Electronic Surface and Interface Structure: Band Alignment in Thin-Film Solar Cells --
Miscellaneous information 15.5.
Title Summary --
-- References --
Miscellaneous information 16.
Title Elemental Distribution Profiling of Thin Films for Solar Cells /
Statement of responsibility Raquel Caballero --
Miscellaneous information 16.1.
Title Introduction --
Miscellaneous information 16.2.
Title Glow Discharge-Optical Emission (GD-OES) and Glow Discharge-Mass Spectroscopy (GD-MS) --
Miscellaneous information 16.2.1.
Title Principles --
Miscellaneous information 16.2.2.
Title Instrumentation --
Miscellaneous information 16.2.2.1.
Title Plasma Sources --
Miscellaneous information 16.2.2.2.
Title Plasma Conditions --
Miscellaneous information 16.2.2.3.
Title Detection of Optical Emission --
Miscellaneous information 16.2.2.4.
Title Mass Spectroscopy --
Miscellaneous information 16.2.3.
Title Quantification --
Miscellaneous information 16.2.3.1.
Title Glow Discharge-Optical Emission Spectroscopy --
Miscellaneous information 16.2.3.2.
Title Glow Discharge-Mass Spectroscopy --
Miscellaneous information 16.2.4.
Title Applications --
Miscellaneous information 16.2.4.1.
Title Glow Discharge-Optical Emission Spectroscopy --
Miscellaneous information 16.2.4.2.
Title Glow Discharge-Mass Spectroscopy --
Miscellaneous information 16.3.
Title Secondary Ion Mass Spectrometry (SIMS) --
Miscellaneous information 16.3.1.
Title Principle of the Method --
Miscellaneous information 16.3.2.
Title Data Analysis --
Miscellaneous information 16.3.3.
Title Quantification --
Miscellaneous information 16.3.4.
Title Applications for Solar Cells --
Miscellaneous information 16.4.
Title Auger Electron Spectroscopy (AES) --
Miscellaneous information 16.4.1.
Title Introduction --
Miscellaneous information 16.4.2.
Title The Auger Process --
Miscellaneous information 16.4.3.
Title Auger Electron Signals.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 16.4.4.
Title Instrumentation --
Miscellaneous information 16.4.5.
Title Auger Electron Signal Intensities and Quantification --
Miscellaneous information 16.4.6.
Title Quantification --
Miscellaneous information 16.4.7.
Title Application --
Miscellaneous information 16.5.
Title X-Ray Photoelectron Spectroscopy (XPS) --
Miscellaneous information 16.5.1.
Title Theoretical Principles --
Miscellaneous information 16.5.2.
Title Instrumentation --
Miscellaneous information 16.5.3.
Title Application to Thin Film Solar Cells --
Miscellaneous information 16.6.
Title Energy-Dispersive X-Ray Analysis on Fractured Cross Sections --
Miscellaneous information 16.6.1.
Title Basics on Energy-Dispersive X-Ray Spectrometry in a Scanning Electron Microscope --
Miscellaneous information 16.6.2.
Title Spatial Resolutions --
Miscellaneous information 16.6.3.
Title Applications --
Miscellaneous information 16.6.3.1.
Title Sample Preparation --
-- References --
Miscellaneous information 17.
Title Hydrogen Effusion Experiments /
Statement of responsibility Florian Einsele --
Miscellaneous information 17.1.
Title Introduction --
Miscellaneous information 17.2.
Title Experimental Setup --
Miscellaneous information 17.3.
Title Data Analysis --
Miscellaneous information 17.3.1.
Title Identification of Rate-Limiting Process --
Miscellaneous information 17.3.2.
Title Analysis of Diffusing Hydrogen Species from Hydrogen Effusion Measurements --
Miscellaneous information 17.3.3.
Title Analysis of H2 Surface Desorption --
Miscellaneous information 17.3.4.
Title Analysis of Diffusion-Limited Effusion --
Miscellaneous information 17.3.5.
Title Analysis of Effusion Spectra in Terms of Hydrogen Density of States --
Miscellaneous information 17.3.6.
Title Analysis of Film Microstructure by Effusion of Implanted Rare Gases.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 17.4.
Title Discussion of Selected Results --
Miscellaneous information 17.4.1.
Title Amorphous Silicon and Germanium Films --
Miscellaneous information 17.4.1.1.
Title Material Density versus Annealing and Hydrogen Content --
Miscellaneous information 17.4.1.2.
Title Effect of Doping on H Effusion --
Miscellaneous information 17.4.2.
Title Amorphous Silicon Alloys: Si-C --
Miscellaneous information 17.4.3.
Title Microcrystalline Silicon --
Miscellaneous information 17.4.4.
Title Zinc Oxide Films --
Miscellaneous information 17.5.
Title Comparison with Other Experiments --
Miscellaneous information 17.6.
Title Concluding Remarks --
-- References --
Miscellaneous information pt. Four
Title Materials and Device Modeling --
Miscellaneous information 18.
Title Ab-Initio Modeling of Defects in Semiconductors /
Statement of responsibility Johan Pohl --
Miscellaneous information 18.1.
Title Introduction --
Miscellaneous information 18.2.
Title Density Functional Theory and Methods --
Miscellaneous information 18.2.1.
Title Basis Sets --
Miscellaneous information 18.2.2.
Title Functionals for Exchange and Correlation --
Miscellaneous information 18.2.2.1.
Title Local Approximations --
Miscellaneous information 18.2.2.2.
Title Functionals Beyond LDA/GGA --
Miscellaneous information 18.3.
Title Methods Beyond DFT --
Miscellaneous information 18.4.
Title From Total Energies to Materials' Properties --
Miscellaneous information 18.5.
Title Ab-initio Characterization of Point Defects --
Miscellaneous information 18.5.1.
Title Thermodynamics of Point Defects --
Miscellaneous information 18.5.2.
Title Formation Energies from Ab-Initio Calculations --
Miscellaneous information 18.5.3.
Title Case study Point Defects in ZnO --
Miscellaneous information 18.6.
Title Conclusions --
-- References --
Miscellaneous information 19.
Title One-Dimensional Electro-Optical Simulations of Thin-Film Solar Cells /
Statement of responsibility Thomas Kirchartz.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 19.1.
Title Introduction --
Miscellaneous information 19.2.
Title Fundamentals --
Miscellaneous information 19.3.
Title Modeling Hydrogenated Amorphous and Microcrystalline Silicon --
Miscellaneous information 19.3.1.
Title Density of States and Transport Hydrogenated Amorphous Silicon --
Miscellaneous information 19.3.2.
Title Density of States and Transport Hydrogenated Microcrystalline Silicon --
Miscellaneous information 19.3.3.
Title Modeling Recombination in a-Si: H and & mu;c-Si: H --
Miscellaneous information 19.3.3.1.
Title Recombination Statistics for Single-Electron States: Shockley-Read-Hall Recombination --
Miscellaneous information 19.3.3.2.
Title Recombination Statistics for Amphoteric States --
Miscellaneous information 19.3.4.
Title Modeling Cu(In, Ga)Se2 Solar Cells --
Miscellaneous information 19.3.4.1.
Title Graded Band-Gap Devices --
Miscellaneous information 19.3.4.2.
Title Issues when Modeling Graded Band-Gap Devices --
Miscellaneous information 19.3.4.3.
Title Example --
Miscellaneous information 19.3.5.
Title Modeling of CdTe Solar Cells --
Miscellaneous information 19.3.5.1.
Title Baseline --
Miscellaneous information 19.3.5.2.
Title The & Phi;b -- NAc (Barrier-Doping) Trade-Off --
Miscellaneous information 19.3.5.3.
Title C-V Analysis as an Interpretation Aid of I-V Curves --
Miscellaneous information 19.4.
Title Optical Modeling of Thin Solar Cells --
Miscellaneous information 19.4.1.
Title Coherent Modeling of Flat Interfaces --
Miscellaneous information 19.4.2.
Title Modeling of Rough Interfaces --
Miscellaneous information 19.5.
Title Tools --
Miscellaneous information 19.5.1.
Title AFORS-HET --
Miscellaneous information 19.5.2.
Title AMPS-1D --
Miscellaneous information 19.5.3.
Title ASA --
Miscellaneous information 19.5.4.
Title PC1D --
Miscellaneous information 19.5.5.
Title SCAPS.
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 19.5.6.
Title SC-SIMUL --
-- References --
Miscellaneous information 20.
Title Two- and Three-Dimensional Electronic Modeling of Thin-Film Solar Cells /
Statement of responsibility Wyatt K. Metzger --
Miscellaneous information 20.1.
Title Introduction --
Miscellaneous information 20.2.
Title Applications --
Miscellaneous information 20.3.
Title Methods --
Miscellaneous information 20.3.1.
Title Equivalent-Circuit Modeling --
Miscellaneous information 20.3.2.
Title Solving Semiconductor Equations --
Miscellaneous information 20.4.2.1.
Title Creating a Semiconductor Model --
Miscellaneous information 20.4.
Title Examples --
Miscellaneous information 20.4.1.
Title Equivalent-Circuit Modeling Examples --
Miscellaneous information 20.4.2.
Title Semiconductor Modeling Examples --
Miscellaneous information 20.5.
Title Summary --
-- References.
588 0# -
-- Print version record.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Photovoltaic cells
General subdivision Materials
-- Research.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element TECHNOLOGY & ENGINEERING
General subdivision Mechanical.
Source of heading or term bisacsh
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Rau, U.
Fuller form of name (Uwe)
Relator code edt
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Abou-Ras, Daniel.
Relator code edt
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Kirchartz, Thomas.
Relator code edt
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Print version:
Title Advanced characterization techniques for thin film solar cells.
Place, publisher, and date of publication Weinheim, Germany : Wiley-VCH, ©2011
International Standard Book Number 3527410031
Record control number (OCoLC)676728907
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527636280">http://onlinelibrary.wiley.com/book/10.1002/9783527636280</a>
Public note Wiley Online Library
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