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Transmission electron microscopy of silicon VLSI circuits and structures / R.B. Marcus and T.T. Sheng.
Material type:
TextPublication details: New York : Wiley, c1983.Description: x, 217 p. : ill. ; 29 cmISBN: - 0471092517
- 621.38173 19
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds | |
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Central Library, KUET General Stacks | 621.38173 MAR (Browse shelf(Opens below)) | 1 | Available | 3010010110 |
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| 621.38173 HNA Users guidebook to digital CMOS integrated circuits / | 621.38173 HON Op amps and linear integrated circuits / | 621.38173 LEN Manual for integrated circuit users / | 621.38173 MAR Transmission electron microscopy of silicon VLSI circuits and structures / | 621.38173 MCC Digital logic design and applications : | 621.38173 MIL Integrated electronics : | 621.38173 MIL Integrated electronics : |
"A Wiley-Interscience publication."
Includes bibliographical references and index.
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