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Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.

Contributor(s): Gupta, D. C. (Dinesh C.) | Bacher, Fred R, 1955- | Hughes, William M, 1948-.
Material type: materialTypeLabelBookPublisher: West Conshohocken, PA : ASTM, c1998Description: 392 p. : ill. ; 24 cm.ISBN: 0803124899.Subject(s): Semiconductors -- Testing -- Congresses | Service life (Engineering) -- Forecasting -- Congresses | Electronic measurements -- CongressesDDC classification: 621.38152
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Item type Current location Call number Copy number Status Date due Barcode Item holds
Books Books Central Library, KUET
General Stacks
621.38152 REC (Browse shelf) 1 Available 3010032500
Total holds: 0

Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.

"STP 1340."

Includes bibliographical references and indexes.

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