Welcome to Online Public Access Catalogue (OPAC)

Normal view MARC view ISBD view

Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.

Contributor(s): Gupta, D. C. (Dinesh C.) | Bacher, Fred R, 1955- | Hughes, William M, 1948-.
Material type: materialTypeLabelBookPublisher: West Conshohocken, PA : ASTM, c1998Description: 392 p. : ill. ; 24 cm.ISBN: 0803124899.Subject(s): Semiconductors -- Testing -- Congresses | Service life (Engineering) -- Forecasting -- Congresses | Electronic measurements -- CongressesDDC classification: 621.38152
Tags from this library: No tags from this library for this title. Log in to add tags.
Item type Current location Call number Copy number Status Date due Barcode Item holds
Books Books Central Library, KUET
General Stacks
621.38152 REC (Browse shelf) 1 Available 3010032500
Total holds: 0

Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.

"STP 1340."

Includes bibliographical references and indexes.

There are no comments for this item.

Log in to your account to post a comment.

Khulna University of Engineering & Technology

Funded by: HEQEP, UGC, Bangladesh