TY  - BOOK
AU  - Buchanan,William
TI  - Microelectronic systems: design, modelling, and testing 
SN  - 0340677716
U1  - 621.395 21
PY  - 1997///
CY  - London, New York, NY
PB  - Arnold, Wiley
KW  - Microelectronics
KW  - Integrated circuits
KW  - Design and construction
N1  - Includes index
ER  -