Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moisés Padilla.
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- text
- computer
- online resource
- 1306840880
- 9781306840880
- 9783527681082
- 3527681086
- 3527411526
- 9783527411528
- 9783527681105 (ePub)
- 3527681108 (ePub)
- 530.8
- QC39 .S384 2014
Edition statement from running title area.
Includes bibliographical references and index.
Online resource; title from PDF title page (Wiley, viewed August 1, 2014).
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