| 000 | 03612cam a2200937Ii 4500 | ||
|---|---|---|---|
| 001 | ocn881028799 | ||
| 003 | OCoLC | ||
| 005 | 20171224114640.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 140606t20142014gw a ob 001 0 eng d | ||
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_a1306840880 _q(electronic bk.) |
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| 020 |
_a9781306840880 _q(electronic bk.) |
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_a9783527681082 _q(electronic bk.) |
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_a3527681086 _q(electronic bk.) |
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| 020 | _z9783527681075 | ||
| 020 | _z3527681078 | ||
| 020 | _z9783527681099 | ||
| 020 | _z3527681094 | ||
| 020 |
_z9783527411528 _q(print) |
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| 020 | _a3527411526 | ||
| 020 | _a9783527411528 | ||
| 020 | _a9783527681105 (ePub) | ||
| 020 | _a3527681108 (ePub) | ||
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| 035 |
_a(OCoLC)881028799 _z(OCoLC)890067315 _z(OCoLC)908035721 |
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| 037 |
_a615339 _bMIL |
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| 050 | 4 |
_aQC39 _b.S384 2014 |
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_aSCI _x055000 _2bisacsh |
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| 082 | 0 | 4 | _a530.8 |
| 049 | _aMAIN | ||
| 100 | 1 |
_aServín, Manuel, _eauthor. |
|
| 245 | 1 | 0 |
_aFringe pattern analysis for optical metrology : _btheory, algorithms, and applications / _cManuel Servin, J. Antonio Quiroga, and J. Moisés Padilla. |
| 250 | _aFirst edition. | ||
| 264 | 1 |
_aWeinheim : _bWiley-VCH, _c[2014] |
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| 264 | 4 | _c©2014 | |
| 300 |
_a1 online resource (xvi, 328 pages) : _billustrations |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 500 | _aEdition statement from running title area. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 588 | 0 | _aOnline resource; title from PDF title page (Wiley, viewed August 1, 2014). | |
| 650 | 0 | _aInterferometry. | |
| 650 | 0 | _aDiffraction patterns. | |
| 650 | 0 | _aOptical measurements. | |
| 650 | 7 |
_aSCIENCE _xEnergy. _2bisacsh |
|
| 650 | 7 |
_aSCIENCE _xMechanics _xGeneral. _2bisacsh |
|
| 650 | 7 |
_aSCIENCE _xPhysics _xGeneral. _2bisacsh |
|
| 650 | 7 |
_aDiffraction patterns. _2fast _0(OCoLC)fst00893521 |
|
| 650 | 7 |
_aInterferometry. _2fast _0(OCoLC)fst00976235 |
|
| 650 | 7 |
_aOptical measurements. _2fast _0(OCoLC)fst01046776 |
|
| 650 | 7 |
_aInterferometrie. _0(DE-588)4027296-5 _2gnd |
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| 650 | 7 |
_aBeugungsfigur. _0(DE-588)4631881-1 _2gnd |
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| 655 | 4 | _aElectronic books. | |
| 655 | 0 | _aElectronic books. | |
| 700 | 1 |
_aQuiroga, J. Antonio _q(Juan Antonio), _eauthor. |
|
| 700 | 1 |
_aPadilla, J. Moisés _q(José Moisés), _eauthor. |
|
| 776 | 0 | 8 |
_iPrint version: _aServín, Manuel. _tFringe pattern analysis for optical metrology. _dWeinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, [2014] _z9783527411528 _w(OCoLC)884739610 |
| 856 | 4 | 0 |
_uhttp://onlinelibrary.wiley.com/book/10.1002/9783527681075 _zWiley Online Library |
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