000 01212nam a2200289 a 4500
008 120118r20081995ii a b 001 0 eng d
010 _a94029098
020 _a9788131701829
020 _a0470234458
020 _a0582237793
040 _aDLC
_cDLC
_dDLC
_dBD-KhUET
082 0 0 _a530.8
_221
100 1 _aBentley, John P.
245 1 0 _aPrinciples of measurement systems /
_cJohn P. Bentley.
250 _a3rd ed.
260 _aHarlow [England] :
_bLongman Scientific & Technical ;
_aNew York, NY :
_bWiley ;
_aNew Delhi :
_bPearson Education,
_cc1995 [third impression 2008].
300 _a480 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 0 _aPhysical instruments.
650 0 _aPhysical measurements.
650 0 _aEngineering instruments.
650 0 _aAutomatic control.
999 _c3040
_d3040
952 _p3010044463
_40
_eTrim Education
_00
_bKUETCL
_10
_o530.8 BEN
_d2011-10-11
_t1
_70
_cGEN
_2ddc
_g701.25 Tk.
_yBK
_aKUETCL
952 _p3010044462
_40
_eTrim Education
_00
_bKUETCL
_10
_o530.8 BEN
_d2011-10-11
_t2
_70
_cGEN
_2ddc
_g701.25 Tk.
_yBK
_aKUETCL